Honorary Speakers

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Dr. Frank Härtig is the Vice-President of Physikalisch-Technische Bundesanstalt (PTB), Germany. He is an expert in metrology and mechanical engineering and holds a doctoral degree from the University of Karlsruhe. With extensive experience in both industry and research in measurement technology, he has played a key role in the development of modern metrology, including the Virtual Coordinate Measuring Machine (VCMM). He has also been actively involved in advancing Digital Quality Infrastructure and the application of AI in metrology. In addition, he has served as President of the International Measurement Confederation and has made significant contributions to the international metrology community.

This plenary presentation explores emerging trends and future directions in quality infrastructure (QI) in response to rapid technological transformation. It highlights the role of digitalisation, including the integration of machine-actionable data and digital workflows, in enhancing the efficiency and interoperability of QI systems. The talk also examines the application of advanced technologies such as artificial intelligence (AI) in supporting data-driven decision-making and automation. Emphasis will be placed on how these developments contribute to improving the reliability, transparency, and global comparability of measurement and conformity assessment systems. The presentation will provide insights into how future QI can better support innovation, international trade, and sustainable development.

Dr. Barbara Goldstein is the Associate Director of the Physical Measurement Laboratory at the National Institute of Standards and Technology (NIST), where she oversees one of the organization’s largest units, supporting measurement science for commercial, defense, and research applications. She also leads the “NIST on a Chip” program, which advances a new paradigm for precision measurement through deployable, quantum-based standards.

She plays an active role in international collaboration in quantum technologies, serving as Chair of IMEKO TC25 on quantum measurement and quantum information, and contributing to global standardization initiatives. With extensive experience in standards development and technology programs, she has led major efforts in areas such as e-commerce, the Internet of Things, and advanced manufacturing, supporting innovation and industry at scale.

This plenary presentation explores the development of quantum-enabled measurement systems and their role in shaping the future of metrology. It highlights advances in deployable, SI-traceable quantum technologies, including initiatives such as “NIST on a Chip,” which aim to bring precision measurement capabilities directly to end users. The talk will discuss how these innovations can transform measurement services by enhancing accessibility, reliability, and scalability. It will also consider the implications for quality infrastructure and international collaboration, particularly in supporting emerging industries and advanced technologies. The presentation provides a forward-looking perspective on integrating quantum measurement into practical applications and global metrology frameworks.

Mr. Sho Tatsuno is the President and Chief Executive Officer of Tatsuno Corporation, a company specializing in energy infrastructure and fuel dispensing systems. He leads initiatives to support a stable energy supply while advancing the transition toward decarbonisation and next-generation energy solutions.

This plenary presentation addresses Japan’s efforts toward achieving a decarbonised society while ensuring a stable and reliable energy supply. It highlights the transition from conventional energy systems to emerging alternatives, including hydrogen and other low-carbon energy sources. The talk will discuss key challenges in balancing energy security, sustainability, and technological innovation, as well as the role of industry in driving this transition. It will also present ongoing initiatives to develop a resilient and sustainable energy infrastructure that supports long-term environmental goals. The presentation offers insights into practical pathways for energy transition and the broader implications for global sustainability and industrial transformation.

Dr. Nicolas Spethmann is the Head of the Quantum Technology Competence Center (QTZ) at Physikalisch-Technische Bundesanstalt (PTB), Germany’s national metrology institute. He received his Ph.D. from the University of Bonn in 2012, specializing in quantum technology.

He joined PTB in 2017 and currently leads efforts to bridge fundamental research and practical applications in quantum technologies through metrology. He is also actively involved in international standardization and collaboration in the field of quantum technology.

This keynote addresses the transition of quantum technologies from fundamental research to real-world applications. It focuses on the essential role of metrology in enabling reliable, scalable, and reproducible quantum systems. The presentation will highlight current challenges in measurement, standardisation, and validation, which are critical for the development and deployment of quantum technologies. It will also discuss the importance of international collaboration, including contributions from NMIs and initiatives such as IMEKO and NMI-Q, in building a robust measurement infrastructure. By strengthening measurement capabilities and standards, metrology plays a key role in accelerating innovation and ensuring the practical impact of quantum technologies across industries.

Dr. Sascha Eichstädt is the leader of the department “Metrology for digital transformation” at the Physikalisch-Technische Bundesanstalt (PTB) since mid-2021. He received his Diploma in Mathematics in 2008 at the Humboldt University Berlin, and his PhD in Theoretical Physics in 2012 at the Technical University Berlin. He is a passionate metrologist since 2008 when he joined the group “Mathematical modelling and data analysis” at PTB to work on measurement uncertainty for time series. In 2017 he started his adventures in digital transformation of metrology as working group leader of the group “Coordination Digitalization” in the Presidential Staff of PTB. He chaired the EURAMET working group "Metrology for digital transformation” from 2020-2022. Sascha Eichstädt is chairing the OIML Digitalisation Task Group since 2022 and the IMEKO Technical Committee on Digitalisation since 2021.

The digital transformation of metrology is redefining both scientific and legal measurement systems, enabling more efficient, transparent, and interoperable quality infrastructures. This keynote highlights key developments such as digital calibration certificates, machine-readable data, and trusted data exchange frameworks.

From the perspectives of OIML, IMEKO, and EURAMET, the talk will address efforts to harmonise digital approaches across regions, ensuring consistency and mutual recognition. It will also discuss challenges related to interoperability, data integrity, and trust.

Finally, the presentation will explore how digital metrology supports emerging needs in industry and regulation, contributing to a more connected, efficient, and future-ready global measurement system.

Dr. Fernando Castro is the Head of Science at the National Physical Laboratory (NPL), UK, where he leads Advanced Materials and Semiconductors. He is a recognized international expert in metrology, with extensive experience across academia, industry, and government.

His work focuses on emerging semiconductor materials and advanced measurement techniques, including nanoscale characterization, scanning probe microscopy, and optical spectroscopy. He also contributes to standardization, pre-standards research, and international coordination in advanced materials and semiconductor technologies.

He plays a leading role in shaping global metrology strategies and has contributed to major international research and policy initiatives. He holds several prominent international roles, including the Chair of the European Metrology Network on Advanced Manufacturing and leadership positions within VAMAS.

This keynote highlights the critical role of measurement science in advancing materials and semiconductor technologies that underpin modern industry. It will address the growing need for high-precision, traceable measurements to support the development, characterization, and quality assurance of advanced materials. The talk will explore challenges related to nanoscale measurement, standardisation, and reproducibility, particularly in the context of rapidly evolving semiconductor applications. It will also discuss the importance of international collaboration and coordinated research efforts in strengthening measurement capabilities. By enabling reliable and comparable data, metrology plays a key role in accelerating innovation, supporting industrial competitiveness, and ensuring the integrity of next-generation technologies.

Coming soon!

Coming soon!